설명
ANALYTICAL EQUIPMENT환경 설정
•E-beam Resolution3nm @ 1KV •Ion-beam Resolution7nm/22nA, Magnum •Stage5 Axis, Eucentric, Motorized •Stage Travel50 x 50 mm •Z, R25mm, 360 deg •Tilt-10 -+52 •Sample EntryFront Drawer or LL •Gas Chemistry"Two included (material of choice)2 additional can be added as options" •SoftwareFEI xP •OSWin NT •Vacuum: Turbo •EDX - optional •BSE - optional •STEM - optional •Liftout - optionalOEM 모델 설명
The FEI Strata DB 235 is a dual-beam system that combines the capabilities of a focused ion beam (FIB) and a scanning electron microscope (SEM). It features both a Hexalens electron column and a Magnum ion column, making it well-suited for failure analysis and high-end sample preparation. The SEM component uses a Schottkey emitter and operates at 200-300 kV, while the FIB component uses Gallium liquid metal and operates at 5 to 30 kV with a current range of 1pA to 20 nA. The system offers high resolution, with 3 nm for SEM and 7 nm for FIB. It is controlled by the Window NT system and can perform automated TEM sample preparation. An attached EDAX electron dispersive X-ray analysis system allows for chemical analysis. Additionally, the FIB/SEM has the unique ability to add or remove material with high spatial resolution between precisely defined locations.문서
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
STRATA DB 235
검증됨
카테고리
FIB
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
20858
웨이퍼 사이즈:
알 수 없음
빈티지:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
STRATA DB 235
검증됨
카테고리
FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
20858
웨이퍼 사이즈:
알 수 없음
빈티지:
2001
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
ANALYTICAL EQUIPMENT환경 설정
•E-beam Resolution3nm @ 1KV •Ion-beam Resolution7nm/22nA, Magnum •Stage5 Axis, Eucentric, Motorized •Stage Travel50 x 50 mm •Z, R25mm, 360 deg •Tilt-10 -+52 •Sample EntryFront Drawer or LL •Gas Chemistry"Two included (material of choice)2 additional can be added as options" •SoftwareFEI xP •OSWin NT •Vacuum: Turbo •EDX - optional •BSE - optional •STEM - optional •Liftout - optionalOEM 모델 설명
The FEI Strata DB 235 is a dual-beam system that combines the capabilities of a focused ion beam (FIB) and a scanning electron microscope (SEM). It features both a Hexalens electron column and a Magnum ion column, making it well-suited for failure analysis and high-end sample preparation. The SEM component uses a Schottkey emitter and operates at 200-300 kV, while the FIB component uses Gallium liquid metal and operates at 5 to 30 kV with a current range of 1pA to 20 nA. The system offers high resolution, with 3 nm for SEM and 7 nm for FIB. It is controlled by the Window NT system and can perform automated TEM sample preparation. An attached EDAX electron dispersive X-ray analysis system allows for chemical analysis. Additionally, the FIB/SEM has the unique ability to add or remove material with high spatial resolution between precisely defined locations.문서
문서 없음