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T5221
카테고리
Final Test개요
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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