Advantest offers solutions for a wide variety of semiconductors and test needs, from SoC and memory, to R&D evaluation and system level test.

ADVANTEST

T5376

T5585

T5371

T5593 Advantest's test systems for memory semiconductors aimed at the high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM and DRAM semiconductor market. SRAM, or static random access memory, is a type of memory semiconductor that, unlike DRAM, does not need to be refreshed while the power supply remains. SGRAM, a synchronous graphics random access memory, is a type of memory semiconductor used for graphics. The T5593 are designed for use in the design and production of super high-speed memory devices and the T5593 can simultaneously measure up to maximum of 256 DDR2-SDRAM devices.

 T5593

The T2000 platform adopts a module architecture and can be flexibly reconfigured by rearranging the necessary functional modules according to the application. A rich variety of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, provide a wide range of test coverage and offer solutions at optimal cost. This makes it possible to have a scalable system configuration ranging from an air cooling system with 9 slots to a liquid cooling system with 52 slots and up to 8,192 channels.

Advantest provides compact solutions with reduced initial investment for development and small lot productions, and high-efficiency multiple-DUT parallel measurement solutions for mass productions. The T2000 responds quickly to market needs with minimal capital investment.

T2000

The T5375 and T5377 are multi-functional test systems for memory semiconductors that reduce testing costs for semiconductor manufacturers. The T5375 and T5377 are used for the front-end testing of DRAM semiconductors and for back-end testing of flash memory semiconductors. The T5375 and T5377 can test up to 256 devices at one time. The  T5375 and T5377 are aimed at capturing an increased market share in front-end DRAM semiconductor testing and has double the throughput capabilities of the T5371, the predecessor to the T5375, thereby lowering overall testing costs for its customers.

T5375

The T5588, makes possible simultaneous measurement of up to 512 DDR2-SDRAM devices, twice that of the T5593, and is a test system for mass production. 

T5588

The T5375 and T5377 are multi-functional test systems for memory semiconductors that reduce testing costs for semiconductor manufacturers. The T5375 and T5377 are used for the front-end testing of DRAM semiconductors and for back-end testing of flash memory semiconductors. The T5375 and T5377 can test up to 256 devices at one time. The  T5375 and T5377 are aimed at capturing an increased market share in front-end DRAM semiconductor testing and has double the throughput capabilities of the T5371, the predecessor to the T5375, thereby lowering overall testing costs for its customers. In particular, the T5377 optimizes its memory repair analytical structure to a user's memory repair algorithm and, due to its higher capabilities, is suited for the production of semiconductors in manufacturing facilities that use 300 millimeter wafers.

T5377

Advantest‘s new T5592 Memory Test System for use in the mass production of Direct Rambus DRAM (D-RDRAM). The T5592 is capable of testing up to 64 devices in parallel and has a testing speed of 1.066 GHz.

T5592

The T6373’s high-speed/precision digitizer and DC (LCD ch) test unit are configured for per-pin operation. When testing many-pin/precision (10 bit/1024 gradation) driver ICs, this tester boasts throughput of up to 150% greater than that of its predecessor.

T6373

T3347A

The T2000 EPP system enables module splitting, in which one module can test multiple devices concurrently. Each device under test (DUT) can be monitored and assessed independently.

T2000 EPP

T5335P

The T6362 and T6372 are test systems for non memory semiconductors for semiconductors used with high-definition LCD displays. This system can simultaneously test multiple semiconductors for LCD driver integrated circuits with a total of up to 1,536 pins.

T6372

The T6577 test systems for SoC semiconductors in the T6500 series are primarily designed to test MCU and SoC semiconductors that control digital consumer products at the production lines. The T6500 series is approximately one-third in size, and uses approximately 50% less power, as compared to Advantest's predecessor product line. Further, the T6500 series operates on a software that is compatible with T6600 series.

T6577

MPT3000ENV

T 5771ES

T6535

T5581H

T2000 LSMF
The T2000 platform adopts a module architecture and can be flexibly reconfigured by rearranging the necessary functional modules according to the application. A rich variety of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, provide a wide range of test coverage and offer solutions at optimal cost. This makes it possible to have a scalable system configuration ranging from an air cooling system with 9 slots to a liquid cooling system with 52 slots and up to 8,192 channels.

T2000 LS

T3347

The T6673 is designed to reduce total test costs associated with the production of SoC semiconductors. The T6673 is designed to test SiC semiconductors incorporated into high-speed communication network equipment and wireless handsets, digital consumer products and other electronic systems. The T6673 can test semiconductor chips with a maximum pin count 1,024, thus matching the trend of SoC semiconductors with increasing pin counts. The T6673 is capable of both front- and back-end testing of SoC semiconductors.

T6673

HIFIX

The top-of-the-line device in the T5500 series is the T5501, a memory semiconductor test system most suitable for testing and production of ultra high-speed memory semiconductor such as the next generation SGRAM. This model allows twice as much spectrum band to be covered in terms of testing speed as the T5593 and thus enhances the measurement accuracy.

T5501

T5372

T5335

High-speed test solution up to 4.5 Gbps
Capable of testing up to 512 DDR4-SDRAM devices in parallel
Full compatibility as an upgrade on Advantest's T5503 test platform

T5503HS

T6672

T5365P

T5771

T6371

B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.

B6700S

T6575

The T2000 IPS (Integrated Power Device Test Solution) provides high-performance, high-throughput testing of devices for automotive and power management applications. The T200 offers a comprehensive set of feature-rich capabilities for testing devices used in automotive and power management applications. It also contributes to significantly reducing test costs by delivering increased throughput while maintaining high quality testing. 

T2000 IPS

The T8571 is a test system for non memory semiconductors that is primarily used to evaluate and analyze CCDs that are image sensors. These semiconductors are used in digital consumer products, such as high-resolution digital cameras, mobile phone handset cameras and digital video cameras.

T8571

D3186 is a high-performance pulse pattern generator to generate 7 types of pseudo-random (PRBS) patterns from 2(7)-1 to 2(31) -1, programmable (WORD) patterns up to SM 2(23) bits, or frame patterns of SDH or SONET structure at very high speed from 150 Mb/s to 12 Gb/s. Moreover, a system, which is used to evaluate the bit error rate of super-high speed optical communication devices and compound semiconductors, can be structured by combining D3186 with the D3286 error detector.

D3186

The T5383, which is capable of simultaneously testing up to 384 devices and has the same footprint as the T5377S with the capacity to test up to 50% more devices at one time, is a test system with a maximum testing rate is 286 MHz/572 Mbps, which is twice the testing rate for Advantest's previous model.

T5383

T5571P

T6573

High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.

T6391

The T5377S, which Advantest introduced in response to customers' needs for a smaller sized model of the T5377 and the T5372, which meets demand for 200mm wafer production lines, contribute to a higher share of the front-end testing market.

T5377S

T5781 Engineering Station (T5781ES), which is designed for evaluation of devices and development of test programs in a developmental / laboratory environment. 

T5781ES

ND1 6371

The T5503 and T5503A are memory semiconductor test systems suitable for the mass production of DDR3-SDRAM, LPDDR2 and LPDDR3 (1 Gbps-2 Gbps class high-speed memory semiconductors).

T5503A

The T5586 Memory Test System enables high throughput testing of DDR SDRAMs.

T5586

Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices.  With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.

T2000 AiR

T5581P

T5382

ADVANTEST’s T5385 memory test system for DRAM wafer test delivers an unrivaled 768-DUT parallel test capacity and 533 Mbps capability for increased throughput and lowered cost of test.  Ideal for high-volume wafer fabs, the new tester is equipped with a flexible pin configuration that supports diverse DRAM devices, allowing tester pin resources to be optimally allocated for efficiency, reduced touchdowns and improved throughput. Achieving improved efficiency per device while scaling even higher in parallelism, the T5385 also delivers Known Good Die (KGD) for consumer devices, to greatly improve yields for LPDDR2 and DDR3 multi-die and stacked devices.

T5385

T5382A

T5365

D3286

T6362

T6331

T5381A

T 5503F

As the SSD market continues to grow, device manufacturers need a low-cost way to test their expanding product portfolios. The MPT3000HVM and MPT3000HVM2 testers provide broad capabilities to handle virtually any SSD, from the highest performing enterprise drives to the most cost-effective client devices. This unmatched functionality presents a major advantage in the rapidly changing SSD market.

MPT3000HVM

The T7721 and T7722 are test systems for non memory semiconductors for mixed signal integrated circuits. 

T7722

Advantest’s T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications, meeting the test needs of new device types that demand as much as 4X the test speed of previous generations. The T5773’s operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773’s innovative design achieves significant power and floorspace savings, helping to lower customer test costs dramatically. Advantest also offers a compatible T5773ES, an engineering system for R&D use.

T5773

Memory Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.

T5851ES

T2000 GS

T5591R

The MPT3000HES and MPT3000HES2 systems offer the same modular hardware, operating software, thermal performance and interfaces as other members of its product family. What distinguishes this tester is a smaller yet highly efficient configuration. The MPT3000HES's and MPT3000HES2's compact size and tester-per-DUT performance make it ideally suited for applications such as low-volume testing and "copy exactly" engineering support for the MPT3000HVM and MPT3000HVM2 production test systems.

MPT3000HES

P2000

T3334

T 53P

T5723ES

T5581

T6683

T6567

H5620ES

The T5761 covers the full range of testing, from NAND-type flash memory testing to package testing. The T5761 is capable of simultaneous testing up to 512 devices, which is twice the capability of Advantest's previous model, and allow for lower testing costs through its improved ability to detect failures. 

T5761

T5311

T3326A

The T7912 developed based on these device-measuring technologies cultivated in a lapse of long time is an analog test system that supports performance evaluation as well as mass production tests. It will strongly assist customers' businesses enabling high quality tests of excellent cost performance as well.

T7912

Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.

MPT3000ES2

Advantest commercialized the T5831 for NAND-type flash memories. 

T5831

T5581D

T5833ES

T7315

B6700DES incorporates all capabilities of B6700D into a smaller configuration for engineering purpose. It contributes to a reduced TAT (turn around time) from R&D to device production.

B6700DES

T6565A

T5332P

MPT3000HES2

MPT3000EV2

Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest's second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.

T5503HS2

The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.

T5851

T5336

T5331

The T5385ES Memory Test System for DRAM Development Designed for engineering use, the smaller T5385ES offers all the functional and performance qualities of the T5385. Device engineering and characterization can easily be performed, and test programs developed on the T5385ES can be seamlessly transferred to the T5385, accelerating the DRAM development processes.

T5385ES

T5331P

T2000 ISS

MPT3000HVM2

The T5761ES retains the same capabilities and functions as the T5761 with a substantially smaller size an at lower testing costs. The T5761ES is capable of simultaneous testing up to 16 devices, evaluation devices in a simplified manner and easily making testing programs available for mass-production. Through the use of the T5761/T5761ES, effective solutions can be structured, from the design of NAND-type flash memory to mass production.

T5761ES

T3324

T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) - the main device types used in smart phones and tablets - are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.

T5833

The top-of-the-line device in the T5500 series is the T5503, a memory semiconductor test system most suitable for testing and production of ultra high-speed memory semiconductors such as DDR3-SDRAM. This model allows twice as much of the spectrum band to be covered in terms of testing speed as the T5501 and this enhances the measurement accuracy.

ADVANTEST

개요

활성 등재물

총 제품 수

서비스

상위 ADVANTEST Final Test

T5376

20 등재물

T5585

17 등재물

T5371

13 등재물

T5593

11 등재물

Moov에 등재하고 즉시 완벽한 구매자를 찾으십시오.

모든 ADVANTEST Final Test