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설명
DMDXAMS082218-1115 1 Base System with 20 Slot Test Head 1 Workstation - PC-D1 1 208VAC 1 Digit Multimeter - 34401A 2 DPIN96 Digital 96ch 100MHz 64M Vector Depth 1 SDU System & DUT Utility Board 12 Air Management Baffle 1 Standard 22 Inch LCD Monitor 1 Parallel/TTL Handler Inteface Card for CPU 1 System Test Interface환경 설정
Workstation: PC-D1 DMM: 34401 Test Head: 1 Part No. -SDU: 1 DPIN96-64 -License 32M: 8 -License 64M: DPS16: 2 Others -PIB+Tower+PIB Stiffener: 1 -Manipulator: 1 -Docking kit: 2 -TTL cable: 1 -GPIB cable: 1OEM 모델 설명
The LTX-Credence Diamondx Tester is a versatile and air-cooled platform designed to efficiently test the complete signal chain, covering power, RF, and MCU (Microcontroller Unit) devices. It offers a universal testing capability, enabling comprehensive assessments of different types of semiconductor devices without unnecessary platform overhead.문서
문서 없음
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
101551
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
COHU / LTX-CREDENCE
DIAMONDx
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
101551
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
DMDXAMS082218-1115 1 Base System with 20 Slot Test Head 1 Workstation - PC-D1 1 208VAC 1 Digit Multimeter - 34401A 2 DPIN96 Digital 96ch 100MHz 64M Vector Depth 1 SDU System & DUT Utility Board 12 Air Management Baffle 1 Standard 22 Inch LCD Monitor 1 Parallel/TTL Handler Inteface Card for CPU 1 System Test Interface환경 설정
Workstation: PC-D1 DMM: 34401 Test Head: 1 Part No. -SDU: 1 DPIN96-64 -License 32M: 8 -License 64M: DPS16: 2 Others -PIB+Tower+PIB Stiffener: 1 -Manipulator: 1 -Docking kit: 2 -TTL cable: 1 -GPIB cable: 1OEM 모델 설명
The LTX-Credence Diamondx Tester is a versatile and air-cooled platform designed to efficiently test the complete signal chain, covering power, RF, and MCU (Microcontroller Unit) devices. It offers a universal testing capability, enabling comprehensive assessments of different types of semiconductor devices without unnecessary platform overhead.문서
문서 없음