설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The IP750EMP is a powerful and flexible testing system built with Teradyne’s J750 VLSI test platform, which has over 1,700 systems installed worldwide. It is an upgrade to the IP750 series systems and can be easily upgraded on-site to the IP750EP and the IP750EMP with enhanced image data processing speed to adapt to today’s rapidly changing market. The IP750EMP is designed for shorter test time, featuring a multiple-PC architecture that allows image data processing (IDP) for multiple sites to be done individually but simultaneously. This provides a flexible solution for the needs of large IDP device testing. With its advanced capabilities, the IP750EMP is a reliable and efficient choice for your testing needs.문서
문서 없음
TERADYNE
IP750EMP
검증됨
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
97106
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
TERADYNE
IP750EMP
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
97106
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The IP750EMP is a powerful and flexible testing system built with Teradyne’s J750 VLSI test platform, which has over 1,700 systems installed worldwide. It is an upgrade to the IP750 series systems and can be easily upgraded on-site to the IP750EP and the IP750EMP with enhanced image data processing speed to adapt to today’s rapidly changing market. The IP750EMP is designed for shorter test time, featuring a multiple-PC architecture that allows image data processing (IDP) for multiple sites to be done individually but simultaneously. This provides a flexible solution for the needs of large IDP device testing. With its advanced capabilities, the IP750EMP is a reliable and efficient choice for your testing needs.문서
문서 없음