설명
Tester환경 설정
환경 설정 없음OEM 모델 설명
The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.문서
문서 없음
TERADYNE
IP750EP
검증됨
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
72196
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TERADYNE
IP750EP
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
72196
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Tester환경 설정
환경 설정 없음OEM 모델 설명
The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.문서
문서 없음