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TERADYNE J750
    설명
    설명 없음
    환경 설정
    -Power supply: 3Φ AC380V ± 10 % ( The AC Power Vault may need to be rewired to produce the 208 VAC required to power the tester ) - Air source: 70~101 PSI -Power supply: 3Φ AC380V ± 10 % ( The AC Power Vault may need to be rewired to produce the 208 VAC required to power the tester ) -Air source: 70~101 PSI -Four Wire Delta: Three (3) phases plus ground -Five Wire Wye: Three (3) phases plus ground and neutral -Frequency: 50 or 60Hz ± 2Hz -Line Variations: ± 5% -Noise Transients: Less than 300 volts, not to exceed 8msec. and 1 watt -External RFI: 10KHz-1.6MHz 1.6MHz-30MHz
    OEM 모델 설명
    The J750 Family of semiconductor test systems by Teradyne is a compact and economical solution that delivers high-efficiency parallel test in a small system footprint. The J750 Family is available in 512 pin, 1024 pin, and J750k configurations, each with its own set of features and capabilities. The 512 pin and 1024 pin configurations both have a clock speed of 100 MHz, while the J750k has a clock speed of 66 MHz / 33 MHz. All configurations come with IG-XL software built on Windows and Microsoft Excel, and offer various options for memory test, converter test, mixed signal test, RFID, scan, APMU channels, high voltage drivers, and device power supplies.
    문서

    문서 없음

    TERADYNE

    J750

    verified-listing-icon

    검증됨

    카테고리
    Final Test

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    99839


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    TERADYNE J750

    TERADYNE

    J750

    Final Test
    빈티지: 2002조건: 중고
    마지막 검증일60일 이상 전

    TERADYNE

    J750

    verified-listing-icon
    검증됨
    카테고리
    Final Test
    마지막 검증일: 60일 이상 전
    listing-photo-47fc666b84e14b329a6d4f6ffc565532-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    99839


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    -Power supply: 3Φ AC380V ± 10 % ( The AC Power Vault may need to be rewired to produce the 208 VAC required to power the tester ) - Air source: 70~101 PSI -Power supply: 3Φ AC380V ± 10 % ( The AC Power Vault may need to be rewired to produce the 208 VAC required to power the tester ) -Air source: 70~101 PSI -Four Wire Delta: Three (3) phases plus ground -Five Wire Wye: Three (3) phases plus ground and neutral -Frequency: 50 or 60Hz ± 2Hz -Line Variations: ± 5% -Noise Transients: Less than 300 volts, not to exceed 8msec. and 1 watt -External RFI: 10KHz-1.6MHz 1.6MHz-30MHz
    OEM 모델 설명
    The J750 Family of semiconductor test systems by Teradyne is a compact and economical solution that delivers high-efficiency parallel test in a small system footprint. The J750 Family is available in 512 pin, 1024 pin, and J750k configurations, each with its own set of features and capabilities. The 512 pin and 1024 pin configurations both have a clock speed of 100 MHz, while the J750k has a clock speed of 66 MHz / 33 MHz. All configurations come with IG-XL software built on Windows and Microsoft Excel, and offer various options for memory test, converter test, mixed signal test, RFID, scan, APMU channels, high voltage drivers, and device power supplies.
    문서

    문서 없음

    유사 등재물
    모두 보기
    TERADYNE J750

    TERADYNE

    J750

    Final Test빈티지: 2002조건: 중고마지막 검증일:60일 이상 전
    TERADYNE J750

    TERADYNE

    J750

    Final Test빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    TERADYNE J750

    TERADYNE

    J750

    Final Test빈티지: 0조건: 중고마지막 검증일:60일 이상 전