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TERADYNE UFLEX-SC
  • TERADYNE UFLEX-SC
  • TERADYNE UFLEX-SC
  • TERADYNE UFLEX-SC
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OEM 모델 설명
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.
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카테고리
Final Test

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

82734


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

TERADYNE

UFLEX-SC

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검증됨
카테고리
Final Test
마지막 검증일: 60일 이상 전
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주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

82734


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음
환경 설정
환경 설정 없음
OEM 모델 설명
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.
문서

문서 없음