설명
FEI FIB 800 Focused Ion Beam (FIB) System Does not include GIS Missing molecular pump And the controller.환경 설정
Configuration: ISA Interface Joystick Oil pump Hard Disk Drive (HDD) I-Gun: Type: Prelens column Beam current: 1 pA - 11 nA Vacuum types: Mechanical pump Ion getter pump Stage type: Motor stage for XL50, 8" Type: Load lock Detector: CDEM Operating system: MS Windows NTOEM 모델 설명
The FEI FIB 800 is a state-of-the-art Focused Ion Beam (FIB) system that is utilized for a variety of applications, including circuit editing, defect and failure analysis, TEM lamella preparation, nanofabrication, nanoprototyping, and MEMS. It employs a Magnum ion column and boasts a milling power of 21nA beam current. The system can accommodate samples with diameters up to 200mm and features a 5-axis motorized eucentric tilt stage. Additionally, it includes a gas injection system with up to four injectors and a vacuum system with column IGP, air-cooled Turbo, and mechanical PVP.문서
문서 없음
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
FIB 800
검증됨
카테고리
Inspection Equipment
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
106614
웨이퍼 사이즈:
8"/200mm
빈티지:
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
FIB 800
카테고리
Inspection Equipment
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
106614
웨이퍼 사이즈:
8"/200mm
빈티지:
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
FEI FIB 800 Focused Ion Beam (FIB) System Does not include GIS Missing molecular pump And the controller.환경 설정
Configuration: ISA Interface Joystick Oil pump Hard Disk Drive (HDD) I-Gun: Type: Prelens column Beam current: 1 pA - 11 nA Vacuum types: Mechanical pump Ion getter pump Stage type: Motor stage for XL50, 8" Type: Load lock Detector: CDEM Operating system: MS Windows NTOEM 모델 설명
The FEI FIB 800 is a state-of-the-art Focused Ion Beam (FIB) system that is utilized for a variety of applications, including circuit editing, defect and failure analysis, TEM lamella preparation, nanofabrication, nanoprototyping, and MEMS. It employs a Magnum ion column and boasts a milling power of 21nA beam current. The system can accommodate samples with diameters up to 200mm and features a 5-axis motorized eucentric tilt stage. Additionally, it includes a gas injection system with up to four injectors and a vacuum system with column IGP, air-cooled Turbo, and mechanical PVP.문서
문서 없음