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COCOS, SILC & EPI-t Test Capabilities For Analyzing 200mm & 300mm Wafers 300mm (dia.) Anodized Aluminum Hot Chuck 300mm (dia.) Gold Plated Measurement Chuck PRI ATM 407-1-S Wafer Handling Robot PRI ESC-212B Robot Controller EQUIPE TECHNOLOGIES PRE -4281 Wafer Prealigner 2ea NEWPORT RESEARCH MM3000 Motion Controllers 2ea SDI PDM-40a Control Boxes SDI Temperature Control Box SDI Corona Switch Box SDI I/O Control Box SDI Opto Coupler SDI BNC Switch Box SDI 12V/24V Power Supply SDI Height Sensor Control Box SDI Vacuum/Pneumatic Control Box WAVETEK Model 29 10 MHz DDS Function Generator 2ea BERTRAN 2341-1 High Voltage Power Supplies EG&G 7265 DSP Lock-In Amplifier HEWLETT PACKARD Vectra VE6/450 Computer 3.5” Floppy Disc Drive 100GB Jazz Drive MITSUBISHI LXA550W LCD Monitor OMEGA HX92 Humidity Sensor/Transmitter ADE 3800 Probe Sensor Control BoxOEM 모델 설명
The SEMILAB FAaST 330 is an electrical metrology system that uses non-contact methods to measure the properties of materials. It combines two patented techniques, known as Micro and Macro corona-Kelvin methods, into one platform. This system is designed to support both advanced research and development and high-volume manufacturing environments. The FAaST 330/230 DSPV systems provide fast, non-contact monitoring of heavy metal contamination in wafers, with the ability to detect even very low levels of contamination. The FAaST 330/230 C-V / I-V systems use advanced measurement techniques to provide non-contact imaging of dielectric and interface properties on monitor wafers. These systems include automated wafer handling and are suitable for medium to high-volume manufacturing environments.문서
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SEMILAB
FAAST 330
검증됨
카테고리
Metrology
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
24311
웨이퍼 사이즈:
12"/300mm
빈티지:
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
SEMILAB
FAAST 330
검증됨
카테고리
Metrology
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
24311
웨이퍼 사이즈:
12"/300mm
빈티지:
1999
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
COCOS, SILC & EPI-t Test Capabilities For Analyzing 200mm & 300mm Wafers 300mm (dia.) Anodized Aluminum Hot Chuck 300mm (dia.) Gold Plated Measurement Chuck PRI ATM 407-1-S Wafer Handling Robot PRI ESC-212B Robot Controller EQUIPE TECHNOLOGIES PRE -4281 Wafer Prealigner 2ea NEWPORT RESEARCH MM3000 Motion Controllers 2ea SDI PDM-40a Control Boxes SDI Temperature Control Box SDI Corona Switch Box SDI I/O Control Box SDI Opto Coupler SDI BNC Switch Box SDI 12V/24V Power Supply SDI Height Sensor Control Box SDI Vacuum/Pneumatic Control Box WAVETEK Model 29 10 MHz DDS Function Generator 2ea BERTRAN 2341-1 High Voltage Power Supplies EG&G 7265 DSP Lock-In Amplifier HEWLETT PACKARD Vectra VE6/450 Computer 3.5” Floppy Disc Drive 100GB Jazz Drive MITSUBISHI LXA550W LCD Monitor OMEGA HX92 Humidity Sensor/Transmitter ADE 3800 Probe Sensor Control BoxOEM 모델 설명
The SEMILAB FAaST 330 is an electrical metrology system that uses non-contact methods to measure the properties of materials. It combines two patented techniques, known as Micro and Macro corona-Kelvin methods, into one platform. This system is designed to support both advanced research and development and high-volume manufacturing environments. The FAaST 330/230 DSPV systems provide fast, non-contact monitoring of heavy metal contamination in wafers, with the ability to detect even very low levels of contamination. The FAaST 330/230 C-V / I-V systems use advanced measurement techniques to provide non-contact imaging of dielectric and interface properties on monitor wafers. These systems include automated wafer handling and are suitable for medium to high-volume manufacturing environments.문서
문서 없음