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ONTO / NANOMETRICS / ACCENT / BIO-RAD TRAJECTORY T3
    설명
    Film Thickness Measurement System
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Trajectory T³ is a cutting-edge metrology module developed by Nanometrics for monitoring and controlling critical processes in semiconductor fabs worldwide. It has been approved for integration by leading process tool manufacturers and has set new standards for speed, reliability, and cost. With its robust large area optical collectors, simple yet powerful spectral detectors, and a MTBF of over 10,000 hours, the Trajectory T³ minimizes cost while maximizing performance. Capable of processing over 250 wafers per hour, it can measure every process wafer even on the fastest process tools. By enabling process tools to measure thicknesses inside the tool and inside the wafer’s patterned devices, the Trajectory T³ delivers unparalleled advantages in speed, reliability, and cost. It is truly changing the game in integrated metrology.
    문서

    문서 없음

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

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    검증됨

    카테고리
    Metrology

    마지막 검증일: 16일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    83162


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    ONTO / NANOMETRICS / ACCENT / BIO-RAD TRAJECTORY T3

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    Metrology
    빈티지: 0조건: 중고
    마지막 검증일16일 전

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    verified-listing-icon
    검증됨
    카테고리
    Metrology
    마지막 검증일: 16일 전
    listing-photo-0b3875034164430c91275754a78753c6-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    83162


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Film Thickness Measurement System
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Trajectory T³ is a cutting-edge metrology module developed by Nanometrics for monitoring and controlling critical processes in semiconductor fabs worldwide. It has been approved for integration by leading process tool manufacturers and has set new standards for speed, reliability, and cost. With its robust large area optical collectors, simple yet powerful spectral detectors, and a MTBF of over 10,000 hours, the Trajectory T³ minimizes cost while maximizing performance. Capable of processing over 250 wafers per hour, it can measure every process wafer even on the fastest process tools. By enabling process tools to measure thicknesses inside the tool and inside the wafer’s patterned devices, the Trajectory T³ delivers unparalleled advantages in speed, reliability, and cost. It is truly changing the game in integrated metrology.
    문서

    문서 없음

    유사 등재물
    모두 보기
    ONTO / NANOMETRICS / ACCENT / BIO-RAD TRAJECTORY T3

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    Metrology빈티지: 0조건: 중고마지막 검증일:16일 전