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CAMECA IMS-4F
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    OEM 모델 설명
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
    문서
    파일 아이콘

    Cameca IMS 4F.pdf

    CAMECA

    IMS-4F

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    카테고리
    Metrology

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보
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    제품 ID:

    59344

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    CAMECA IMS-4F

    CAMECA

    IMS-4F

    Metrology
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    CAMECA

    IMS-4F

    verified-listing-icon
    검증됨
    카테고리
    Metrology
    마지막 검증일: 60일 이상 전
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/6027a6c6966e452c84838e38578e628e_labspettrometriamassaionisecondarifig1_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/7018c249ae3a4cb89a782aa35ba9ca62_labspettrometriamassaionisecondarifig2_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/5fc16fa72d9a45638a4b5862c3cbd5ca_labspettrometriamassaionisecondarifig3_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/f13014b6090a4b92ac6128cf5d69b72b_labspettrometriamassaionisecondarifig7_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/ab7df4728de24c968735e271aaf17ccd_1902f26f8f1844638b6c54599010528a1201a_mw.jpeg
    주요 품목 세부 정보
    조건:

    Used

    작동 상태:

    알 수 없음

    제품 ID:

    59344

    웨이퍼 사이즈:

    알 수 없음

    빈티지:

    알 수 없음

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
    문서
    파일 아이콘

    Cameca IMS 4F.pdf

    유사 등재물
    모두 보기
    CAMECA IMS-4F

    CAMECA

    IMS-4F

    Metrology빈티지: 0조건: 중고마지막 검증일: 60일 이상 전