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KLA / FILMETRICS F80
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    OEM 모델 설명
    The Filmetrics F80 is a high-speed, small-spot, hyperspectral-imaging film thickness measurement instrument. It performs measurements on patterned wafers up to 200mm in diameter. The hyperspectral imaging system utilizes a revolutionary pattern recognition technique that can distinguish regions in the field of view based on their film stack, composition, and thickness.
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    KLA / FILMETRICS

    F80

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    검증됨

    카테고리
    Metrology

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    76659


    웨이퍼 사이즈:

    8"/200mm, 12"/300mm


    빈티지:

    알 수 없음

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    KLA / FILMETRICS F80

    KLA / FILMETRICS

    F80

    Metrology
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    KLA / FILMETRICS

    F80

    verified-listing-icon
    검증됨
    카테고리
    Metrology
    마지막 검증일: 60일 이상 전
    listing-photo-9e64ed6466ac481cb738fb70f80195e0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42191/9e64ed6466ac481cb738fb70f80195e0/4cf5e99ef87e462ba0fc1c0f3d61093c_125f6b83f03744968f806fee105c9d9b1201a_mw.jpeg
    listing-photo-9e64ed6466ac481cb738fb70f80195e0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42191/9e64ed6466ac481cb738fb70f80195e0/005d06d1afd841d5a8e69f49c5135245_82791d5ec11541b9a5c18231cd77b88f1201a_mw.jpeg
    listing-photo-9e64ed6466ac481cb738fb70f80195e0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/42191/9e64ed6466ac481cb738fb70f80195e0/dffc795321c84a849fe8cbbc7de6449a_c6a49f054ace49aea5bb9320fc621e391201a_mw.jpeg
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    76659


    웨이퍼 사이즈:

    8"/200mm, 12"/300mm


    빈티지:

    알 수 없음


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Filmetrics F80 is a high-speed, small-spot, hyperspectral-imaging film thickness measurement instrument. It performs measurements on patterned wafers up to 200mm in diameter. The hyperspectral imaging system utilizes a revolutionary pattern recognition technique that can distinguish regions in the field of view based on their film stack, composition, and thickness.
    문서
    유사 등재물
    모두 보기
    KLA / FILMETRICS F80

    KLA / FILMETRICS

    F80

    Metrology빈티지: 0조건: 중고마지막 검증일: 60일 이상 전