설명
Contamination Measurement환경 설정
환경 설정 없음OEM 모델 설명
A non-contact, corona-based silicon and oxide charge monitoring system configured for wafer-to-wafer cassette handling of 200 mm wafers. System measures electrical characteristics such as charge composition, interface quality, dielectric thickness, and charge contamination of semiconductors and dielectric films. Measurements performed with easy to use Windows NT-based software interface. An Offline Recipe Generator and Data Analysis package provides added remote recipe generation and data analysis capabilities.문서
문서 없음
KEITHLEY
Quantox 64000
검증됨
카테고리
Metrology
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
96003
웨이퍼 사이즈:
8"/200mm
빈티지:
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KEITHLEY
Quantox 64000
카테고리
Metrology
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
96003
웨이퍼 사이즈:
8"/200mm
빈티지:
1998
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Contamination Measurement환경 설정
환경 설정 없음OEM 모델 설명
A non-contact, corona-based silicon and oxide charge monitoring system configured for wafer-to-wafer cassette handling of 200 mm wafers. System measures electrical characteristics such as charge composition, interface quality, dielectric thickness, and charge contamination of semiconductors and dielectric films. Measurements performed with easy to use Windows NT-based software interface. An Offline Recipe Generator and Data Analysis package provides added remote recipe generation and data analysis capabilities.문서
문서 없음