설명
설명 없음환경 설정
-300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5TOEM 모델 설명
The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.문서
문서 없음
KLA / MICROSENSE
PKMRAM
검증됨
카테고리
Metrology
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
106397
웨이퍼 사이즈:
12"/300mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / MICROSENSE
PKMRAM
카테고리
Metrology
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
106397
웨이퍼 사이즈:
12"/300mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
-300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5TOEM 모델 설명
The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.문서
문서 없음