설명
설명 없음환경 설정
Missing: Power Supply - AC-DC PS Vacuum Board Cable Pneumatic box's air one touch connector Clamp cylinder sensor LP3 HUB USB Port Ethernet Switch - 8 Port Ionizer Controller Power Supply - FEC PS FEC Fixture Panel (bottom) Malfunction: Pneumatic Box V3 USB 3.0 4 Port Panel Mount Hub Robot Controller Pre-aligner CPU LP3 I/F LP3 Shinko Mapper Motor with Brake Shinko Fiber-Optic Amplifier SensorOEM 모델 설명
The Archer 300 LCM is a high-performance, low-cost metrology system for 2Xnm logic and 1Xnm half-pitch memory devices. It offers precision, fast measurement speed, and in-field metrology capability. Improvements to the imaging-based optical subsystem result in better overlay measurement specifications than the previous-generation Archer 200. The system provides cost-effective characterization of overlay error and CD on lithography process layers for double patterning and other advanced technologies. It is also seamlessly integrated with K-T Analyzer, an advanced data analysis system, and Recipe Database Manager (RDM), a centralized database of production-proven recipe components. The Archer 300 LCM is suitable for double patterning technologies, scanner qualification, and in-line monitoring.문서
문서 없음
KLA
ARCHER 300
검증됨
카테고리
Metrology
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
44347
웨이퍼 사이즈:
알 수 없음
빈티지:
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
ARCHER 300
검증됨
카테고리
Metrology
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
44347
웨이퍼 사이즈:
알 수 없음
빈티지:
2002
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
Missing: Power Supply - AC-DC PS Vacuum Board Cable Pneumatic box's air one touch connector Clamp cylinder sensor LP3 HUB USB Port Ethernet Switch - 8 Port Ionizer Controller Power Supply - FEC PS FEC Fixture Panel (bottom) Malfunction: Pneumatic Box V3 USB 3.0 4 Port Panel Mount Hub Robot Controller Pre-aligner CPU LP3 I/F LP3 Shinko Mapper Motor with Brake Shinko Fiber-Optic Amplifier SensorOEM 모델 설명
The Archer 300 LCM is a high-performance, low-cost metrology system for 2Xnm logic and 1Xnm half-pitch memory devices. It offers precision, fast measurement speed, and in-field metrology capability. Improvements to the imaging-based optical subsystem result in better overlay measurement specifications than the previous-generation Archer 200. The system provides cost-effective characterization of overlay error and CD on lithography process layers for double patterning and other advanced technologies. It is also seamlessly integrated with K-T Analyzer, an advanced data analysis system, and Recipe Database Manager (RDM), a centralized database of production-proven recipe components. The Archer 300 LCM is suitable for double patterning technologies, scanner qualification, and in-line monitoring.문서
문서 없음