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KLA ARCHER AIM
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    OEM 모델 설명
    Archer AIM is an Advanced Optical Overlay Metrology product that improves stepper correction accuracy, provides precise data, and enables design rule segmentation. It delivers industry-leading precision performance, reduces total measurement uncertainty, and increases sampling rate. It also includes offline automatic recipe creation and real-time analysis software. The MPX option enables ‘on product’ monitoring of focus-exposure. Archer AIM targets new standards for lithography process control for 65-nm and beyond, reducing measurement uncertainty and enabling control of overlay error budgets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
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    KLA

    ARCHER AIM

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    검증됨

    카테고리

    Metrology
    마지막 검증일: 60일 이상 전
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    49248


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    2003

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    유사 등재물
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    KLA ARCHER AIM
    KLAARCHER AIMMetrology
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    KLA

    ARCHER AIM

    verified-listing-icon

    검증됨

    카테고리

    Metrology
    마지막 검증일: 60일 이상 전
    listing-photo-43625f203abe414686d7b2005cb2411c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    49248


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    2003


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    Archer AIM is an Advanced Optical Overlay Metrology product that improves stepper correction accuracy, provides precise data, and enables design rule segmentation. It delivers industry-leading precision performance, reduces total measurement uncertainty, and increases sampling rate. It also includes offline automatic recipe creation and real-time analysis software. The MPX option enables ‘on product’ monitoring of focus-exposure. Archer AIM targets new standards for lithography process control for 65-nm and beyond, reducing measurement uncertainty and enabling control of overlay error budgets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA ARCHER AIM
    KLA
    ARCHER AIM
    Metrology빈티지: 0조건: 중고마지막 검증일: 60일 이상 전
    KLA ARCHER AIM
    KLA
    ARCHER AIM
    Metrology빈티지: 2003조건: 중고마지막 검증일: 60일 이상 전
    KLA ARCHER AIM
    KLA
    ARCHER AIM
    Metrology빈티지: 2004조건: 중고마지막 검증일: 60일 이상 전