설명
N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.환경 설정
Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.OEM 모델 설명
미제공문서
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N & K
3700 RT
검증됨
카테고리
Metrology
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
12889
웨이퍼 사이즈:
8"/200mm
빈티지:
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
N & K
3700 RT
카테고리
Metrology
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
12889
웨이퍼 사이즈:
8"/200mm
빈티지:
2004
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.환경 설정
Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.OEM 모델 설명
미제공문서
문서 없음