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ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL
    설명
    Film Thickness Measurement System
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
    문서

    문서 없음

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon

    검증됨

    카테고리
    Metrology

    마지막 검증일: 15일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    104576


    웨이퍼 사이즈:

    8"/200mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    Metrology
    빈티지: 0조건: 중고
    마지막 검증일15일 전

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon
    검증됨
    카테고리
    Metrology
    마지막 검증일: 15일 전
    listing-photo-88c366d2fa174c5dbb22a6d7999573f8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    104576


    웨이퍼 사이즈:

    8"/200mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Film Thickness Measurement System
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
    문서

    문서 없음

    유사 등재물
    모두 보기
    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    Metrology빈티지: 0조건: 중고마지막 검증일:15일 전