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NIKON ECLIPSE ME600
  • NIKON ECLIPSE ME600
  • NIKON ECLIPSE ME600
  • NIKON ECLIPSE ME600
설명
metallographic microscope
환경 설정
1. Eyepiece: CFI 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: manual nose wheel 4. Upper light source: 12V-50W light house light source 5. The body has the function of switching between light and dark field of view 6. Objective lens: 5X. 10X. 20X. 50X 7. CCD adapter mirror 8. Moving bed: 6X4 STAGE
OEM 모델 설명
The microscope is primarily intended for inspection of wafers or chips after development and/or evaporation. It is equipped with an incident (epi) illuminating unit (light is coming from above the specimen) with a Differential Interference Contrast option. It is also equipped with Dark Field option.
문서

문서 없음

카테고리
Microscope

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

74561


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

NIKON

ECLIPSE ME600

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검증됨
카테고리
Microscope
마지막 검증일: 60일 이상 전
listing-photo-c6a618ce93694328b4419891de178a85-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

74561


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
metallographic microscope
환경 설정
1. Eyepiece: CFI 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: manual nose wheel 4. Upper light source: 12V-50W light house light source 5. The body has the function of switching between light and dark field of view 6. Objective lens: 5X. 10X. 20X. 50X 7. CCD adapter mirror 8. Moving bed: 6X4 STAGE
OEM 모델 설명
The microscope is primarily intended for inspection of wafers or chips after development and/or evaporation. It is equipped with an incident (epi) illuminating unit (light is coming from above the specimen) with a Differential Interference Contrast option. It is also equipped with Dark Field option.
문서

문서 없음