설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
Long 1000 x 800 mm stage stroke provides maximum performance in the measurement of large-size workpieces such as FPD devices. Printing masks for substrates. Mother substrates for PCBs. Shadow masks. FPD devices. Long stage stroke enables measurements of LCD substrates/modules and large-size PCBs. Laser AF also enables measurements of height gaps and warping in workpieces. Search function enables measurements of lands and holes of PCBs. Variety of illumination choices facilitate accurate edge detection even for vague geometries. High-speed stage and high-speed image processing provide high throughput.문서
문서 없음
카테고리
Microscope
마지막 검증일: 4일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
156811
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NIKON
NEXIV VMR-10080
카테고리
Microscope
마지막 검증일: 4일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
156811
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
Long 1000 x 800 mm stage stroke provides maximum performance in the measurement of large-size workpieces such as FPD devices. Printing masks for substrates. Mother substrates for PCBs. Shadow masks. FPD devices. Long stage stroke enables measurements of LCD substrates/modules and large-size PCBs. Laser AF also enables measurements of height gaps and warping in workpieces. Search function enables measurements of lands and holes of PCBs. Variety of illumination choices facilitate accurate edge detection even for vague geometries. High-speed stage and high-speed image processing provide high throughput.문서
문서 없음