설명
D3100S-1 Atomic Force Microscope (AFM) Key Features : . Scans samples up to 8 inch . Little or no sample preparation for increased productivity . Rigid ,low vibration construction for superior image quality . Integrated top-view color video optics with 1.5 um resolution and zoom . Easily changes among all AFM/STM scanning modes/techniques without tools . Automated stepping for scanning multiple areas unattended . Trakscan laser tracking system improves image and measurement quality . Laser spot alignment window for easy setup . Superior resolution and linearity in all three dimensions *. Fully refurbished. *. Installed in Clean-room. *. Can demonstrate any time.환경 설정
- Dimension SPM Head - X-Y imaging area approx. 90um square - Z range approx. 6 um - Lateral accuracy typically within 1%, maximum 2% - Standard 150mm vacuum chuck for 100mm,125mm,150mm wafers - Optional 200mm vacuum chuck for 150mm and 200mm wafers - Inspectable Area 125x100mm ; allows coverage of one-half of 150mm wafer without manual sample rotation Full wafer with manual rotation - Nanoscope Dimension 3100 Controller - Nanoscope IIIa Scanning Probe Microscope Controller - System Computer - TMC Micro-G Isolation TableOEM 모델 설명
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.문서
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VEECO / DIGITAL INSTRUMENTS
DIMENSION 3100
검증됨
카테고리
Microscope
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
102010
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
VEECO / DIGITAL INSTRUMENTS
DIMENSION 3100
카테고리
Microscope
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
102010
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
D3100S-1 Atomic Force Microscope (AFM) Key Features : . Scans samples up to 8 inch . Little or no sample preparation for increased productivity . Rigid ,low vibration construction for superior image quality . Integrated top-view color video optics with 1.5 um resolution and zoom . Easily changes among all AFM/STM scanning modes/techniques without tools . Automated stepping for scanning multiple areas unattended . Trakscan laser tracking system improves image and measurement quality . Laser spot alignment window for easy setup . Superior resolution and linearity in all three dimensions *. Fully refurbished. *. Installed in Clean-room. *. Can demonstrate any time.환경 설정
- Dimension SPM Head - X-Y imaging area approx. 90um square - Z range approx. 6 um - Lateral accuracy typically within 1%, maximum 2% - Standard 150mm vacuum chuck for 100mm,125mm,150mm wafers - Optional 200mm vacuum chuck for 150mm and 200mm wafers - Inspectable Area 125x100mm ; allows coverage of one-half of 150mm wafer without manual sample rotation Full wafer with manual rotation - Nanoscope Dimension 3100 Controller - Nanoscope IIIa Scanning Probe Microscope Controller - System Computer - TMC Micro-G Isolation TableOEM 모델 설명
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.문서
문서 없음