설명
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.환경 설정
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.OEM 모델 설명
미제공문서
문서 없음
카테고리
Overlay
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled / Crated
제품 ID:
132024
웨이퍼 사이즈:
12"/300mm
빈티지:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ASML
YieldStar S-200B
카테고리
Overlay
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled / Crated
제품 ID:
132024
웨이퍼 사이즈:
12"/300mm
빈티지:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.환경 설정
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.OEM 모델 설명
미제공문서
문서 없음