설명
Dual open, One system has stainless skins , one has reflective host chuck option . 14.7 Sw. On both. Both have SSD raid drive upgrades .환경 설정
환경 설정 없음OEM 모델 설명
The KLA 5200 is an overlay metrology system that helps chipmakers improve process control and reduce time to market for advanced products with feature sizes down to .18 µm. It uses Coherence Probe Microscopy (CPM) to identify surfaces and can measure all layers, including low-contrast or grainy targets. The KLA 5200 can lower stepper cost-of-ownership by providing high-quality data to prevent lithography process errors, helping manage the overlay budget and maximizing lithography output.문서
문서 없음
KLA
5200
카테고리
Overlay
마지막 검증일: 4일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
137275
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Dual open, One system has stainless skins , one has reflective host chuck option . 14.7 Sw. On both. Both have SSD raid drive upgrades .환경 설정
환경 설정 없음OEM 모델 설명
The KLA 5200 is an overlay metrology system that helps chipmakers improve process control and reduce time to market for advanced products with feature sizes down to .18 µm. It uses Coherence Probe Microscopy (CPM) to identify surfaces and can measure all layers, including low-contrast or grainy targets. The KLA 5200 can lower stepper cost-of-ownership by providing high-quality data to prevent lithography process errors, helping manage the overlay budget and maximizing lithography output.문서
문서 없음