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설명
TnR (1 x Tube, 2 x Wafer)환경 설정
환경 설정 없음OEM 모델 설명
The Ismeca NX32 is a versatile and scalable 32-position turret handler designed for efficient testing and inspection of integrated circuits, LEDs, and discrete devices. This system offers multiple configurations to handle various types of devices: it can handle wafers in film-frame for input and/or output, commonly used for LEDs and wafer-level package (WLP) devices; tray and tube input and/or output, suitable for integrated circuits and discretes; and bowl feeding, tape and de-taping, alignment, laser marking, inspection, and test modules. The NX32 is capable of testing devices at both ambient and hot temperatures, providing flexibility for diverse testing requirements.문서
문서 없음
PREFERRED
SELLER
카테고리
Packaging
마지막 검증일: 60일 이상 전
Buyer pays 12% premium of final sale price
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
106692
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
PREFERRED
SELLER
COHU / ISMECA
NX32
카테고리
Packaging
마지막 검증일: 60일 이상 전
Buyer pays 12% premium of final sale price
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
106692
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
TnR (1 x Tube, 2 x Wafer)환경 설정
환경 설정 없음OEM 모델 설명
The Ismeca NX32 is a versatile and scalable 32-position turret handler designed for efficient testing and inspection of integrated circuits, LEDs, and discrete devices. This system offers multiple configurations to handle various types of devices: it can handle wafers in film-frame for input and/or output, commonly used for LEDs and wafer-level package (WLP) devices; tray and tube input and/or output, suitable for integrated circuits and discretes; and bowl feeding, tape and de-taping, alignment, laser marking, inspection, and test modules. The NX32 is capable of testing devices at both ambient and hot temperatures, providing flexibility for diverse testing requirements.문서
문서 없음