설명
Optical excitation measurement system환경 설정
환경 설정 없음OEM 모델 설명
The RPM2000 is a Photoluminescence (PL) Mapping Tool designed specifically for the Compound Semiconductor market. It can handle substrate sizes of 75mm, 125mm, and 150mm and is used for detecting substrate defects and composition. Photoluminescence is a well-established, non-contact, non-destructive technique used in the development and process control of semiconductors. Room temperature PL wafer maps provide vital information on the uniformity of alloy composition, material quality, and defects in substrates, epilayers, and device structures. The RPM2000 has been designed to obtain whole wafer PL maps in a fraction of the time previously associated with this sort of measurement, giving the ability to measure and assess wafers between production runs. The primary benefit is that rapid feedback and remedial action can be implemented should wafer parameters be out of specification, avoiding wasted production runs thus saving time and costs. In addition, the speed of measurement also makes the incoming inspection and qualification of bought-in wafers a quick and easy task.문서
문서 없음
ONTO / NANOMETRICS / ACCENT / BIO-RAD
RPM2000
검증됨
카테고리
Photoluminescence Mapper
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
108805
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
RPM2000
카테고리
Photoluminescence Mapper
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
108805
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Optical excitation measurement system환경 설정
환경 설정 없음OEM 모델 설명
The RPM2000 is a Photoluminescence (PL) Mapping Tool designed specifically for the Compound Semiconductor market. It can handle substrate sizes of 75mm, 125mm, and 150mm and is used for detecting substrate defects and composition. Photoluminescence is a well-established, non-contact, non-destructive technique used in the development and process control of semiconductors. Room temperature PL wafer maps provide vital information on the uniformity of alloy composition, material quality, and defects in substrates, epilayers, and device structures. The RPM2000 has been designed to obtain whole wafer PL maps in a fraction of the time previously associated with this sort of measurement, giving the ability to measure and assess wafers between production runs. The primary benefit is that rapid feedback and remedial action can be implemented should wafer parameters be out of specification, avoiding wasted production runs thus saving time and costs. In addition, the speed of measurement also makes the incoming inspection and qualification of bought-in wafers a quick and easy task.문서
문서 없음