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설명
This is a UF200 with 6/8 inch SMIF elevator, nickel hot chuck, round ceramic cleaning, no automatic probe card change. In 2006 it received a low noise upgrade and a hardware upgrade for new software management. The plate had been modified to accommodate the Eagle card holder with manual PC loading.환경 설정
Category: Probers Loader: 8 Chuck Type: Hot Temperature Range: +30/150 Chiller: NAOEM 모델 설명
The Accretech UF200 Wafer probing machine is a highly advanced tool with a capacity of 2000 pins. It utilizes Moire scale in the AC servo motor closed-loop control system to achieve fast and precise positioning, boasting a stage accuracy of 2 µm. This machine represents a significant advancement in wafer probing technology, offering users efficient and accurate performance for their probing needs.문서
문서 없음
카테고리
Probers
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
109900
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
ACCRETECH / TSK
UF200
카테고리
Probers
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
109900
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
This is a UF200 with 6/8 inch SMIF elevator, nickel hot chuck, round ceramic cleaning, no automatic probe card change. In 2006 it received a low noise upgrade and a hardware upgrade for new software management. The plate had been modified to accommodate the Eagle card holder with manual PC loading.환경 설정
Category: Probers Loader: 8 Chuck Type: Hot Temperature Range: +30/150 Chiller: NAOEM 모델 설명
The Accretech UF200 Wafer probing machine is a highly advanced tool with a capacity of 2000 pins. It utilizes Moire scale in the AC servo motor closed-loop control system to achieve fast and precise positioning, boasting a stage accuracy of 2 µm. This machine represents a significant advancement in wafer probing technology, offering users efficient and accurate performance for their probing needs.문서
문서 없음