설명
Engineering Wafer Prober환경 설정
Confirm Standard Configuration includes: Stage:12" Travel of Stage:301 mm x 301 mm Theta travel:± 7.5 degrees Microscope spec:Optem A-Zoom Options: Head Stage:NA Test Head Connection Jig:NA Ambient/Room Temp Chuck:-55°C to 200°C Heater ( Yes/No ):Yes (Thermal Controller and Chiller) GP-IB Interface:Yes RS232 Interface:NA Light Source:Yes Table:NA Manuals:NA Mechnical Tester I/F, Tester Model:NA Vacuum:NA DUT sizes:NA Tester Type (Used With):NAOEM 모델 설명
Supports wafer sizes and shards from 0.5 in. (1 mm) to up to 12 in. (300mm) Semi-Automatic Probe Station문서
문서 없음
카테고리
Probers
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
130034
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
FORM FACTOR / CASCADE MICROTECH / FRT
S300
카테고리
Probers
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
130034
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Engineering Wafer Prober환경 설정
Confirm Standard Configuration includes: Stage:12" Travel of Stage:301 mm x 301 mm Theta travel:± 7.5 degrees Microscope spec:Optem A-Zoom Options: Head Stage:NA Test Head Connection Jig:NA Ambient/Room Temp Chuck:-55°C to 200°C Heater ( Yes/No ):Yes (Thermal Controller and Chiller) GP-IB Interface:Yes RS232 Interface:NA Light Source:Yes Table:NA Manuals:NA Mechnical Tester I/F, Tester Model:NA Vacuum:NA DUT sizes:NA Tester Type (Used With):NAOEM 모델 설명
Supports wafer sizes and shards from 0.5 in. (1 mm) to up to 12 in. (300mm) Semi-Automatic Probe Station문서
문서 없음