설명
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS: Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Ni) System Controller: 19-inch rack-mount computer; Windows 10 Professional(TM) operating system and Nucleus(TM) 3.3.4 prober control software. Microscope: Mitutotyo FS50 compound microscope: includes 10X eyepieces and MPlan APO 20X objective len. Additional microscope lenses are sold separately. Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift OPTIONAL ACCESSORIES (sold separately, please inquire about availability) Probe Positioners: We have a limited supply of RF and DC probe positioners in stock, please call for details. Additional Microscope Objective Lenses: Please inquire about additional objective lens magnifications in stock Vibration Isolation Table: Vib-Iso table as shown in photos is an optional accessory that is sold separately and subject to availability at the time of order. We have several different models in stock, please inquire.환경 설정
환경 설정 없음OEM 모델 설명
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization문서
문서 없음
카테고리
Probers
마지막 검증일: 29일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
125825
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 12000
카테고리
Probers
마지막 검증일: 29일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
125825
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements. EQUIPMENT CONFIGURATION & SPECIFICATIONS: Probe Station: Cascade Summit 12000-series semi-automatic wafer probe station with MicroChamber(TM) Wafer Chuck: 8-inch/200mm RF/Microwave wafer chuck (Ni) System Controller: 19-inch rack-mount computer; Windows 10 Professional(TM) operating system and Nucleus(TM) 3.3.4 prober control software. Microscope: Mitutotyo FS50 compound microscope: includes 10X eyepieces and MPlan APO 20X objective len. Additional microscope lenses are sold separately. Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift OPTIONAL ACCESSORIES (sold separately, please inquire about availability) Probe Positioners: We have a limited supply of RF and DC probe positioners in stock, please call for details. Additional Microscope Objective Lenses: Please inquire about additional objective lens magnifications in stock Vibration Isolation Table: Vib-Iso table as shown in photos is an optional accessory that is sold separately and subject to availability at the time of order. We have several different models in stock, please inquire.환경 설정
환경 설정 없음OEM 모델 설명
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization문서
문서 없음