
설명
The Electroglas EG2001X prober is an automatic system designed to probe semiconductor wafers. System does not come with cassette stations. The Electroglas 2001 wafer probers are extremely accurate, modularly designed automatic wafer probers, configured to perform automatic system functions of: Automatic wafer load Automatic wafer alignment Automatic wafer measurement Automatic wafer test/sort. The Electroglas 2001 prober ( EG 2001X, EG 2001CX ) wafer prober station may be seen in other configurations, including any of the following options: Autoalign Autoloader (material handling) Disk Drives & Controller Hot Chuck & Controller Ink Dot Inspection (an Autoalign option) OCR (optical character recognition) Probe Mark Inspection (an Autoalign option) Profiler (non-contact edge sensor)환경 설정
환경 설정 없음OEM 모델 설명
Introducing the EG2001x Automatic Wafer Prober: Designed for semiconductor wafers, it handles 150mm wafers of silicon, glass, or polyimide-coated glass, with the option to use stainless steel, PEN on alumina, and other substrates. Automate loading, alignment, and probing of multiple wafer locations effortlessly. Additionally, it offers manual operation for added flexibility.문서
문서 없음
카테고리
Probers
마지막 검증일: 23일 전
주요 품목 세부 정보
조건:
Refurbished
작동 상태:
알 수 없음
제품 ID:
138388
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기MARTEK / ELECTROGLAS (EG)
EG2001X
카테고리
Probers
마지막 검증일: 23일 전
주요 품목 세부 정보
조건:
Refurbished
작동 상태:
알 수 없음
제품 ID:
138388
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
The Electroglas EG2001X prober is an automatic system designed to probe semiconductor wafers. System does not come with cassette stations. The Electroglas 2001 wafer probers are extremely accurate, modularly designed automatic wafer probers, configured to perform automatic system functions of: Automatic wafer load Automatic wafer alignment Automatic wafer measurement Automatic wafer test/sort. The Electroglas 2001 prober ( EG 2001X, EG 2001CX ) wafer prober station may be seen in other configurations, including any of the following options: Autoalign Autoloader (material handling) Disk Drives & Controller Hot Chuck & Controller Ink Dot Inspection (an Autoalign option) OCR (optical character recognition) Probe Mark Inspection (an Autoalign option) Profiler (non-contact edge sensor)환경 설정
환경 설정 없음OEM 모델 설명
Introducing the EG2001x Automatic Wafer Prober: Designed for semiconductor wafers, it handles 150mm wafers of silicon, glass, or polyimide-coated glass, with the option to use stainless steel, PEN on alumina, and other substrates. Automate loading, alignment, and probing of multiple wafer locations effortlessly. Additionally, it offers manual operation for added flexibility.문서
문서 없음