설명
FEATURES AND BENEFITS - Application flexibility for failure analysis, design and verification, parametric and functional tests - Precision and stability for submicron probing - Accommodates packaged parts and single chips as well as wafers and substrates - Configurations for measuring from attoAmpere level DC to 220 GHz high frequency - Low noise and frost-free measurements from –65°C to 400°C with the SUSS ProbeShield® - Interfaces to leading analysis instrumentation, optics, software and testers - ProberBench operating system, fully operable with or without a PC To Include: (1) Thermochuck 6in환경 설정
- Karl Suss Joystick Controller & Power Supply, - Motorized Mitutoyo Microscope with Mitutoyo Objectives & Eye Piece - Motorized Chuck Platform - Optem Fiber & Illuminator, - Basler Scout IR Camera - Anti-vibration table - Karl Suss Manual High Frequency Probe Head & Arm (PH250HF) - 3units - Probe arm and probe head - 3units - XYZ Edmund Optic Micro Positioners- 1 unitOEM 모델 설명
The SUSS PA200 Semiautomatic Probe System is available as two versions, one for high speed (HS) and one for high resolution (HR) applications. They are both very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8).문서
문서 없음
SUSS MicroTec / KARL SUSS
PA200
검증됨
카테고리
Probers
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
64434
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
SUSS MicroTec / KARL SUSS
PA200
카테고리
Probers
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
64434
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
FEATURES AND BENEFITS - Application flexibility for failure analysis, design and verification, parametric and functional tests - Precision and stability for submicron probing - Accommodates packaged parts and single chips as well as wafers and substrates - Configurations for measuring from attoAmpere level DC to 220 GHz high frequency - Low noise and frost-free measurements from –65°C to 400°C with the SUSS ProbeShield® - Interfaces to leading analysis instrumentation, optics, software and testers - ProberBench operating system, fully operable with or without a PC To Include: (1) Thermochuck 6in환경 설정
- Karl Suss Joystick Controller & Power Supply, - Motorized Mitutoyo Microscope with Mitutoyo Objectives & Eye Piece - Motorized Chuck Platform - Optem Fiber & Illuminator, - Basler Scout IR Camera - Anti-vibration table - Karl Suss Manual High Frequency Probe Head & Arm (PH250HF) - 3units - Probe arm and probe head - 3units - XYZ Edmund Optic Micro Positioners- 1 unitOEM 모델 설명
The SUSS PA200 Semiautomatic Probe System is available as two versions, one for high speed (HS) and one for high resolution (HR) applications. They are both very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8).문서
문서 없음