설명
uss MicroTec PA300 ProbeShield Probing Station, 115V, 60Hz, w/ Seiwa Optical Correct probing microscope, Guppy F-046C IRF camera, FWF10x eyepieces, Mplan Apo 2x/0.55 objective, Mplan Apo 10x/0.28 objective, temp-controlled 12in vacuum chuck, Cascade ProberBench II-LC4-RM electronics module. . Mfg 2006. Includes: Cascade ProberBench Joystick Controller 2; 2ea GBB PicoProbe power supplies; 1ea Suss MicroTec micromanipulator; FormFactor V241-PA3-UP Velox industrial control PC; LED F3000 illumination source; ATT A300 temperature controller . 58in x 40in x 66in H.환경 설정
환경 설정 없음OEM 모델 설명
The PA300 is an analytical prober conforming to EN 61010 - 1: 1993-04 which corresponds to UL 3101-1: 1993 and IEC 1010-1: 1992. By means of the PA300 electrical measurements on wafers and substrates up to a diameter of 300mm can be made. The only electrical connection to the measuring object is through the probecard, the probehead and the chuck.문서
문서 없음
카테고리
Probers
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
123902
웨이퍼 사이즈:
알 수 없음
빈티지:
2006
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
SUSS MicroTec / KARL SUSS
PA300
카테고리
Probers
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
123902
웨이퍼 사이즈:
알 수 없음
빈티지:
2006
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
uss MicroTec PA300 ProbeShield Probing Station, 115V, 60Hz, w/ Seiwa Optical Correct probing microscope, Guppy F-046C IRF camera, FWF10x eyepieces, Mplan Apo 2x/0.55 objective, Mplan Apo 10x/0.28 objective, temp-controlled 12in vacuum chuck, Cascade ProberBench II-LC4-RM electronics module. . Mfg 2006. Includes: Cascade ProberBench Joystick Controller 2; 2ea GBB PicoProbe power supplies; 1ea Suss MicroTec micromanipulator; FormFactor V241-PA3-UP Velox industrial control PC; LED F3000 illumination source; ATT A300 temperature controller . 58in x 40in x 66in H.환경 설정
환경 설정 없음OEM 모델 설명
The PA300 is an analytical prober conforming to EN 61010 - 1: 1993-04 which corresponds to UL 3101-1: 1993 and IEC 1010-1: 1992. By means of the PA300 electrical measurements on wafers and substrates up to a diameter of 300mm can be made. The only electrical connection to the measuring object is through the probecard, the probehead and the chuck.문서
문서 없음