메인 콘텐츠로 건너뛰기
Moov logo

Moov Icon
TEL / TOKYO ELECTRON PRECIO OCTO
    설명
    Wafer Prober
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    Precio octo™ is an 8-inch wafer prober that dramatically increases productivity by using ultra-high-speed indexing and high-speed wafer exchange functions to reduce test costs and improve Cost of Ownership. The structure has been strengthened and major components and optics have been improved to reduce vibration, resulting in superior operation. Additionally, the installation of TELPADS™-I automatic probe mark inspection allows for the assessment of probe card quality and the assurance of probe mark quality
    문서

    문서 없음

    PREFERRED
     
    SELLER
    카테고리
    Probers

    마지막 검증일: 60일 이상 전

    Buyer pays 12% premium of final sale price
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    106690


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    PREFERRED
     
    SELLER

    TEL / TOKYO ELECTRON

    PRECIO OCTO

    verified-listing-icon
    검증됨
    카테고리
    Probers
    마지막 검증일: 60일 이상 전
    listing-photo-a424ee7903364689b4f28092e402a21f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Buyer pays 12% premium of final sale price
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    106690


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Wafer Prober
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    Precio octo™ is an 8-inch wafer prober that dramatically increases productivity by using ultra-high-speed indexing and high-speed wafer exchange functions to reduce test costs and improve Cost of Ownership. The structure has been strengthened and major components and optics have been improved to reduce vibration, resulting in superior operation. Additionally, the installation of TELPADS™-I automatic probe mark inspection allows for the assessment of probe card quality and the assurance of probe mark quality
    문서

    문서 없음