We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 더 알아보기
설명
설명 없음환경 설정
Automatic frame prober Specification of wafer, 6-8" Thickness: 350-1000 um Die size: 350-75000 umOEM 모델 설명
Precio octo™ is an 8-inch wafer prober that dramatically increases productivity by using ultra-high-speed indexing and high-speed wafer exchange functions to reduce test costs and improve Cost of Ownership. The structure has been strengthened and major components and optics have been improved to reduce vibration, resulting in superior operation. Additionally, the installation of TELPADS™-I automatic probe mark inspection allows for the assessment of probe card quality and the assurance of probe mark quality문서
문서 없음
PREFERRED
SELLER
카테고리
Probers
마지막 검증일: 60일 이상 전
Buyer pays 12% premium of final sale price
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
85084
웨이퍼 사이즈:
6"/150mm, 8"/200mm
빈티지:
2016
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
SELLER
TEL / TOKYO ELECTRON
PRECIO OCTO
카테고리
Probers
마지막 검증일: 60일 이상 전
Buyer pays 12% premium of final sale price
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
85084
웨이퍼 사이즈:
6"/150mm, 8"/200mm
빈티지:
2016
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
Automatic frame prober Specification of wafer, 6-8" Thickness: 350-1000 um Die size: 350-75000 umOEM 모델 설명
Precio octo™ is an 8-inch wafer prober that dramatically increases productivity by using ultra-high-speed indexing and high-speed wafer exchange functions to reduce test costs and improve Cost of Ownership. The structure has been strengthened and major components and optics have been improved to reduce vibration, resulting in superior operation. Additionally, the installation of TELPADS™-I automatic probe mark inspection allows for the assessment of probe card quality and the assurance of probe mark quality문서
문서 없음