XP-1
카테고리
Profiler개요
The AMBIOS XP-I profilometer allows the analysis of surface roughness with nanometer depth resolution using an adjustable needle pressure force in the range of 0.05 to 10 mg.
활성 등재물
1
서비스
검사, 보험, 감정, 물류
The AMBIOS XP-I profilometer allows the analysis of surface roughness with nanometer depth resolution using an adjustable needle pressure force in the range of 0.05 to 10 mg.
1
검사, 보험, 감정, 물류
