설명
KLA-Tencor P-10 Surface Profiler Manufacturer: KLA-Tencor Model: P-10 Equipment Type: Surface Profiler Measurement Method: Contact Stylus Maximum Wafer Size: 8 inch (200 mm) Measurement Capabilities: Step Height, Surface Roughness, Waviness Vertical Measurement Range: Up to approximately 300 µm (configuration dependent) Vertical Resolution: 0.5 / 2 / 10 Å (depending on configuration) Scan Length: 60 mm standard; up to 150 mm on some configurations Scan Speed: 1 µm/s to 25 mm/s Stylus Tip: Diamond, 2 µm radius (configuration dependent) Stage: Motorized XY Stage The KLA-Tencor P-10 is a contact stylus surface profiler designed for measuring step height, surface roughness, and waviness on semiconductor wafers and other materials. Specifications depend on the installed measurement head and configuration.환경 설정
환경 설정 없음OEM 모델 설명
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.문서
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KLA
P-10
카테고리
Profiler
마지막 검증일: 8일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
153632
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
KLA-Tencor P-10 Surface Profiler Manufacturer: KLA-Tencor Model: P-10 Equipment Type: Surface Profiler Measurement Method: Contact Stylus Maximum Wafer Size: 8 inch (200 mm) Measurement Capabilities: Step Height, Surface Roughness, Waviness Vertical Measurement Range: Up to approximately 300 µm (configuration dependent) Vertical Resolution: 0.5 / 2 / 10 Å (depending on configuration) Scan Length: 60 mm standard; up to 150 mm on some configurations Scan Speed: 1 µm/s to 25 mm/s Stylus Tip: Diamond, 2 µm radius (configuration dependent) Stage: Motorized XY Stage The KLA-Tencor P-10 is a contact stylus surface profiler designed for measuring step height, surface roughness, and waviness on semiconductor wafers and other materials. Specifications depend on the installed measurement head and configuration.환경 설정
환경 설정 없음OEM 모델 설명
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.문서
문서 없음