설명
설명 없음환경 설정
Condition : Fully operational, Tested Specification : 100% OEM specs Configuration : XP Computer , Software 7.45, XT head (long range), up to 200 mm Includes Step height for calibration Inspection arrangeable? : yes (Including Power Inspection)OEM 모델 설명
The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.문서
문서 없음
KLA
P-16+
검증됨
카테고리
Profiler
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
49721
웨이퍼 사이즈:
알 수 없음
빈티지:
2013
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
P-16+
검증됨
카테고리
Profiler
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
49721
웨이퍼 사이즈:
알 수 없음
빈티지:
2013
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
Condition : Fully operational, Tested Specification : 100% OEM specs Configuration : XP Computer , Software 7.45, XT head (long range), up to 200 mm Includes Step height for calibration Inspection arrangeable? : yes (Including Power Inspection)OEM 모델 설명
The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R&D; departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution, precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.문서
문서 없음