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SENSOFAR PLu NEOX
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    환경 설정
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    OEM 모델 설명
    The PLu neox is the most advanced optical profiler from Sensofar. Based on the successful series of PLu optical surface profilers, the PLu neox covers the broadest range of applications on 3D and thin film metrology due to the combination of confocal scanning, phase shift interferometry, vertical scanning interferometry and spectroscopic reflectometry. This powerful combination allows for fast 2D and 3D analysis of technical surfaces with less than 0.1 nm vertical resolution, the capability to measure steep slopes over 70 degrees on smooth surfaces, and thin film metrology with less than 1 nm of resolution.
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    SENSOFAR

    PLu NEOX

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    검증됨

    카테고리
    Profiler

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    77624


    웨이퍼 사이즈:

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    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Profiler
    빈티지: 2011조건: 중고
    마지막 검증일60일 이상 전

    SENSOFAR

    PLu NEOX

    verified-listing-icon
    검증됨
    카테고리
    Profiler
    마지막 검증일: 60일 이상 전
    listing-photo-5c9985c03af146d9a81d6a84ba2b210a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    77624


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The PLu neox is the most advanced optical profiler from Sensofar. Based on the successful series of PLu optical surface profilers, the PLu neox covers the broadest range of applications on 3D and thin film metrology due to the combination of confocal scanning, phase shift interferometry, vertical scanning interferometry and spectroscopic reflectometry. This powerful combination allows for fast 2D and 3D analysis of technical surfaces with less than 0.1 nm vertical resolution, the capability to measure steep slopes over 70 degrees on smooth surfaces, and thin film metrology with less than 1 nm of resolution.
    문서

    문서 없음

    유사 등재물
    모두 보기
    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Profiler빈티지: 2011조건: 중고마지막 검증일:60일 이상 전
    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Profiler빈티지: 0조건: 중고마지막 검증일:60일 이상 전