설명
Scanning Electron Microscope (SEM)환경 설정
Pump and chiller Known issues: Turbopump requires replacement High stability Schottky field emission gun; Fast chamber evacuation: 2 min; 0.2 to 30 kV; Beam deceleration with stage bias from -150 V to -4 kV; Lowest landing energy 50 V; Optimal high vacuum image resolution: 1.6 nm at 1 kV; 1.0 nm at 15 kV; High vacuum SED, in-lens (TLD), EDX, vCD (high sensitivity low kV BSE) detectors; Optimal low vacuum image resolution: 2.0 nm; Low vacuum LVD, LVD/Helix, GAD (TV-rate solid-state BSE), EDX, vCD (high sensitivity low kV BSE) detectors; 5-axes motorized stage; z axis movable up to 60 mm; -5°/+70° tiltOEM 모델 설명
미제공문서
문서 없음
카테고리
SEM / FIB
마지막 검증일: 12일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
153433
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
NOVA NANOSEM 430
카테고리
SEM / FIB
마지막 검증일: 12일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
153433
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Scanning Electron Microscope (SEM)환경 설정
Pump and chiller Known issues: Turbopump requires replacement High stability Schottky field emission gun; Fast chamber evacuation: 2 min; 0.2 to 30 kV; Beam deceleration with stage bias from -150 V to -4 kV; Lowest landing energy 50 V; Optimal high vacuum image resolution: 1.6 nm at 1 kV; 1.0 nm at 15 kV; High vacuum SED, in-lens (TLD), EDX, vCD (high sensitivity low kV BSE) detectors; Optimal low vacuum image resolution: 2.0 nm; Low vacuum LVD, LVD/Helix, GAD (TV-rate solid-state BSE), EDX, vCD (high sensitivity low kV BSE) detectors; 5-axes motorized stage; z axis movable up to 60 mm; -5°/+70° tiltOEM 모델 설명
미제공문서
문서 없음