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설명
ANALYTICAL EQUIPMENT Process Type: FA SEMs/TEMs/Dual Beams환경 설정
1. Operating system: Win XP 2002, SP3 2. User interface: FEI xT 3.8.10, 10-1-2013 3. SEM SFEG 4. FIB Sidewinder (21nA) 5. GIS Traditional: Traditional: Pt, SCM, IEE and Omni GIS Carbon deposit 6. Detectors ETD, CDM, TLD 7. Additional items: Autoprobe 200, XEI Evactron, ThermoCube chiller 8. Main OEM PC, Support PC (contains Omni GIS software as well as Autoprobe SW)OEM 모델 설명
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.문서
문서 없음
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
43516
웨이퍼 사이즈:
알 수 없음
빈티지:
2008
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
HELIOS NANOLAB 400
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
43516
웨이퍼 사이즈:
알 수 없음
빈티지:
2008
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
ANALYTICAL EQUIPMENT Process Type: FA SEMs/TEMs/Dual Beams환경 설정
1. Operating system: Win XP 2002, SP3 2. User interface: FEI xT 3.8.10, 10-1-2013 3. SEM SFEG 4. FIB Sidewinder (21nA) 5. GIS Traditional: Traditional: Pt, SCM, IEE and Omni GIS Carbon deposit 6. Detectors ETD, CDM, TLD 7. Additional items: Autoprobe 200, XEI Evactron, ThermoCube chiller 8. Main OEM PC, Support PC (contains Omni GIS software as well as Autoprobe SW)OEM 모델 설명
The Helios NanoLab 400 is a DualBeam system that integrates both ion and electron beams for Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) functionality in one machine. This allows users to switch between the two beams for quick and accurate navigation and milling. The convergence of the SEM and FIB at a short working distance enables precision “slice-and-view” cross-sectioning and analysis at high resolution. This system provides a powerful tool for sample preparation and analysis.문서
문서 없음