설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The JEM-2010F Field Emission Electron Microscope is a versatile, high-resolution analytical tool designed for superior image quality and top-tier analytical performance. Developed for the 200kV class analytical TEM, it offers a broad range of capabilities including high-resolution image observation and microarea X-ray analysis. The JEM-2010F can be optionally equipped with energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units, enhancing its functionality and adaptability to various research needs.문서
문서 없음
JEOL
JEM-2010F
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
70438
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The JEM-2010F Field Emission Electron Microscope is a versatile, high-resolution analytical tool designed for superior image quality and top-tier analytical performance. Developed for the 200kV class analytical TEM, it offers a broad range of capabilities including high-resolution image observation and microarea X-ray analysis. The JEM-2010F can be optionally equipped with energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units, enhancing its functionality and adaptability to various research needs.문서
문서 없음