설명
The gun alignment control electronics are currently in need of repair.환경 설정
Ultra thin window energy dispersive XPS Three WDS spectrometers Geller dSspec automation system controlling spectrometers Motorized Stage Imaging modes include secondary electrons, backscattered electrons and x-rays. Under ideal conditions, resolution in secondary electron imaging mode is 5 nm. Images can be recorded with Polaroid film and/or digital image capture through the Geller dPict module with subsequent output to a 1200 dpi laser printer. Characteristic x-rays can be detected from as little as a 1 cubic micrometer volume of the specimen. Elements from atomic number 5 (B) to 92 (U) can be detected in concentrations above 0.001 wt% element. Analysis modes include qualitative, standardless, and fully rigorous standards-based quantitative analysis. Additional capabilities of the Geller software package include analog and digital x-ray mapping and report generation. Both analog and digital x-ray or compositional mapping are available.OEM 모델 설명
미제공문서
문서 없음
JEOL
JSM 6400
검증됨
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
63760
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM 6400
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
63760
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
The gun alignment control electronics are currently in need of repair.환경 설정
Ultra thin window energy dispersive XPS Three WDS spectrometers Geller dSspec automation system controlling spectrometers Motorized Stage Imaging modes include secondary electrons, backscattered electrons and x-rays. Under ideal conditions, resolution in secondary electron imaging mode is 5 nm. Images can be recorded with Polaroid film and/or digital image capture through the Geller dPict module with subsequent output to a 1200 dpi laser printer. Characteristic x-rays can be detected from as little as a 1 cubic micrometer volume of the specimen. Elements from atomic number 5 (B) to 92 (U) can be detected in concentrations above 0.001 wt% element. Analysis modes include qualitative, standardless, and fully rigorous standards-based quantitative analysis. Additional capabilities of the Geller software package include analog and digital x-ray mapping and report generation. Both analog and digital x-ray or compositional mapping are available.OEM 모델 설명
미제공문서
문서 없음