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JEOL JSM-5800LV
  • JEOL JSM-5800LV
설명
The JEOL 5800LV is equipped with a Tungsten emitter, high vacuum, low vacuum, and Turbo vacuum.
환경 설정
환경 설정 없음
OEM 모델 설명
The JSM-5800LV is a versatile, high-performance scanning electron microscope. It delivers a high resolution of 3.5nm, and 5.5nm in Low Vacuum (LV) mode, which is ideal for observing specimens with high water content or non-conductive surfaces. The microscope’s specimen chamber can hold up to an 8-inch diameter specimen and offers automated features like Auto Focus/Stigmator and Automatic Contrast/Brightness. It provides a user-friendly interface with two 12-inch CTRs for high-quality digital imaging. Additional features include color display for secondary electron and backscattered electron images, a fully automated five-axis eucentric specimen stage, digital raster rotation, and on-board image archiving. The JSM-5800LV is widely used across various applications and offers numerous options for increased versatility.
문서

문서 없음

카테고리
SEM / FIB

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

112324


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

JEOL

JSM-5800LV

verified-listing-icon
검증됨
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
listing-photo-465bee289c884d42ba9a35fc3ada579e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43793/465bee289c884d42ba9a35fc3ada579e/d508605102ba4f45a0b86a6bca286d61_1491974550_mw.png
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

112324


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
The JEOL 5800LV is equipped with a Tungsten emitter, high vacuum, low vacuum, and Turbo vacuum.
환경 설정
환경 설정 없음
OEM 모델 설명
The JSM-5800LV is a versatile, high-performance scanning electron microscope. It delivers a high resolution of 3.5nm, and 5.5nm in Low Vacuum (LV) mode, which is ideal for observing specimens with high water content or non-conductive surfaces. The microscope’s specimen chamber can hold up to an 8-inch diameter specimen and offers automated features like Auto Focus/Stigmator and Automatic Contrast/Brightness. It provides a user-friendly interface with two 12-inch CTRs for high-quality digital imaging. Additional features include color display for secondary electron and backscattered electron images, a fully automated five-axis eucentric specimen stage, digital raster rotation, and on-board image archiving. The JSM-5800LV is widely used across various applications and offers numerous options for increased versatility.
문서

문서 없음