설명
FIB -ZEISS 1540EsB XB SYSTEM환경 설정
환경 설정 없음OEM 모델 설명
The 1540EsB CrossBeam® is a powerful tool that combines a fully integrated Energy and angle selective Backscattered electron (EsB) detector. This instrument offers ultra high resolution for surface sensitive SE imaging and compositional information through BSE imaging. The new EsB detection principle features an integrated filtering grid to enhance the image quality and requires no additional adjustments. The EsB detection principle is less sensitive to edge contrast and charging effects, which increases the accuracy in measurements of interfaces, particles, and features.문서
문서 없음
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
128160
웨이퍼 사이즈:
8"/200mm, 12"/300mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
1540 EsB
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
128160
웨이퍼 사이즈:
8"/200mm, 12"/300mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
FIB -ZEISS 1540EsB XB SYSTEM환경 설정
환경 설정 없음OEM 모델 설명
The 1540EsB CrossBeam® is a powerful tool that combines a fully integrated Energy and angle selective Backscattered electron (EsB) detector. This instrument offers ultra high resolution for surface sensitive SE imaging and compositional information through BSE imaging. The new EsB detection principle features an integrated filtering grid to enhance the image quality and requires no additional adjustments. The EsB detection principle is less sensitive to edge contrast and charging effects, which increases the accuracy in measurements of interfaces, particles, and features.문서
문서 없음