설명
Asset Description - Focus Ion Beam Mill Software Version - Windows CIM - NONE Process - Focus Ion Beam Mill Fab Section - Test Excluded Items List (Pumps, Chillers & Abatement are all excluded)환경 설정
System Type Description Quantity Main System FIB tool designed for Packaging and Deep cuts 1 Factory Interface NONE Options System Others Handler System ManualOEM 모델 설명
The Orion NanoFab Helium Ion Microscope (HIM) operates using ionized Helium or Neon gases rather than electrons for imaging and milling of materials. Helium is typically used for imaging and milling very thin films (e.g. graphene), with a spot size ~0.5 nm. Neon is is heavier, and thus better adapted for milling bulk materials and thin films with a spot size of ~2 nm.문서
카테고리
SEM / FIB
마지막 검증일: 9일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
136497
웨이퍼 사이즈:
8"/200mm
빈티지:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
ORION NanoFab
카테고리
SEM / FIB
마지막 검증일: 9일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
136497
웨이퍼 사이즈:
8"/200mm
빈티지:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available