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설명
설명 없음환경 설정
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -Vintage 1999, bought second hand. Installed by Zeiss certified vendor. -6" stage and loadlock. 6” wafer loading thru the loadlock is possible. -Field 6” loadlock and stage. -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Known issues: Some Flickering on image of chamberscope. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.OEM 모델 설명
미제공문서
문서 없음
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Installed / Idle
제품 ID:
102936
웨이퍼 사이즈:
6"/150mm
빈티지:
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
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Refurbishment Services
Available
ZEISS / CARL ZEISS
1560
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Installed / Idle
제품 ID:
102936
웨이퍼 사이즈:
6"/150mm
빈티지:
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -Vintage 1999, bought second hand. Installed by Zeiss certified vendor. -6" stage and loadlock. 6” wafer loading thru the loadlock is possible. -Field 6” loadlock and stage. -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Known issues: Some Flickering on image of chamberscope. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.OEM 모델 설명
미제공문서
문서 없음