설명
설명 없음환경 설정
-Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV -Magnification: Low magnification mode: 60 to 10k x (accuracy ± 10%) High magnification mode: 800 to 2,000k x (accuracy ± 10%) -Electron source: Cold-cathode field emission type electron source -STEM option: brightfield /darkfield STEM Detector, STEM sample holder -EDX X-MAX 80 (2012) AZtec EDX Software Advanced -Point electronic DISS5 (2012) -Hitachi ZONE-TEM Desktop Sample Cleaner (2014) power is 200/208/230 VAC, Single Phase, 50/60 Hz, 4 kVAOEM 모델 설명
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HITACHI
S-5200
검증됨
카테고리
SEM
주요 품목 세부 정보
조건:
Used
작동 상태:
Installed / Running
제품 ID:
96224
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기HITACHI
S-5200
검증됨
카테고리
SEM
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Installed / Running
제품 ID:
96224
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
-Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV -Magnification: Low magnification mode: 60 to 10k x (accuracy ± 10%) High magnification mode: 800 to 2,000k x (accuracy ± 10%) -Electron source: Cold-cathode field emission type electron source -STEM option: brightfield /darkfield STEM Detector, STEM sample holder -EDX X-MAX 80 (2012) AZtec EDX Software Advanced -Point electronic DISS5 (2012) -Hitachi ZONE-TEM Desktop Sample Cleaner (2014) power is 200/208/230 VAC, Single Phase, 50/60 Hz, 4 kVAOEM 모델 설명
미제공문서
문서 없음