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HITACHI SU-70
    설명
    ANALYTICAL EQUIPMENT
    환경 설정
    Imaging: 1.0nm at 15kV WD 4mm 1.6nm at 1kV 1.5mm deceleration mode 2.5nm at 1kV 1.5nm standard mode Magnification: Low Mag mode: 25 – 2,000x High Mag mode: 100- 800,000x Electron Optics: ZrO/W Schottky emission Probe current >200nA at 30kV Specimen Stage: 5 Axis motorization, X: 110mm, Y: 110mm, Z: 1.5 – 40mm, T: -5 to +70, R: 360 deg 150 mm Load Lock
    OEM 모델 설명
    Analytical UHR Schottky Emission Scanning Electron Microscope Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Schottky electron gun. It features not only ultra-high resolution (1.0nm/15kV, 1.6nm/Kv (*)) but also reduced charge-up imaging, compositional-contrast imaging, and ultra-low voltage imaging derived from Hitachi’s highly reputed Super ExB filter technology. The Schottky electron gun enables a wide variety of analytical capabilities due to its high probe current (100nA).
    문서

    문서 없음

    HITACHI

    SU-70

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    검증됨

    카테고리
    SEM

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Refurbished


    작동 상태:

    알 수 없음


    제품 ID:

    36388


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음

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    Logistics Support
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    Money Back Guarantee
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    Transaction Insured by Moov
    Available
    Refurbishment Services
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    유사 등재물
    모두 보기
    HITACHI SU-70

    HITACHI

    SU-70

    SEM
    빈티지: 0조건: 개조됨
    마지막 검증일60일 이상 전

    HITACHI

    SU-70

    verified-listing-icon
    검증됨
    카테고리
    SEM
    마지막 검증일: 60일 이상 전
    listing-photo-bbb7d005085e4963a834569a845d73cd-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Refurbished


    작동 상태:

    알 수 없음


    제품 ID:

    36388


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    ANALYTICAL EQUIPMENT
    환경 설정
    Imaging: 1.0nm at 15kV WD 4mm 1.6nm at 1kV 1.5mm deceleration mode 2.5nm at 1kV 1.5nm standard mode Magnification: Low Mag mode: 25 – 2,000x High Mag mode: 100- 800,000x Electron Optics: ZrO/W Schottky emission Probe current >200nA at 30kV Specimen Stage: 5 Axis motorization, X: 110mm, Y: 110mm, Z: 1.5 – 40mm, T: -5 to +70, R: 360 deg 150 mm Load Lock
    OEM 모델 설명
    Analytical UHR Schottky Emission Scanning Electron Microscope Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Schottky electron gun. It features not only ultra-high resolution (1.0nm/15kV, 1.6nm/Kv (*)) but also reduced charge-up imaging, compositional-contrast imaging, and ultra-low voltage imaging derived from Hitachi’s highly reputed Super ExB filter technology. The Schottky electron gun enables a wide variety of analytical capabilities due to its high probe current (100nA).
    문서

    문서 없음

    유사 등재물
    모두 보기
    HITACHI SU-70

    HITACHI

    SU-70

    SEM빈티지: 0조건: 개조됨마지막 검증일: 60일 이상 전