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설명
BIO-RAD FT-IR QS-300 Spectrometer *. Installed in Clean-room. *. Available demo test anytime.환경 설정
FTS40 Spectrometer - He-Ne Laser - IR Source - DTGS Detector - KBr Beam Splitter .Wafer Tray/Nose Cone .FTS Power Supply .Windows XP PC & LCD Monitor .EPI,BPSG Measurement S/WOEM 모델 설명
The QS-300 is a bench top FT-IR system designed for the analysis of semiconductor material in Fabs and R&D facilities. It features high performance optics with maximum optical throughput, providing precise and accurate measurements in both reflection and transmission modes. The system also has an innovative sample compartment that can accommodate single wafers or slugs of 3 to 200mm, as well as non-standard shape and size silicon substrates. This makes it a versatile tool for analyzing a wide range of semiconductor materials.문서
문서 없음
카테고리
Spectrometer / SIMS
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
65976
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
QS-300
카테고리
Spectrometer / SIMS
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
65976
웨이퍼 사이즈:
8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
BIO-RAD FT-IR QS-300 Spectrometer *. Installed in Clean-room. *. Available demo test anytime.환경 설정
FTS40 Spectrometer - He-Ne Laser - IR Source - DTGS Detector - KBr Beam Splitter .Wafer Tray/Nose Cone .FTS Power Supply .Windows XP PC & LCD Monitor .EPI,BPSG Measurement S/WOEM 모델 설명
The QS-300 is a bench top FT-IR system designed for the analysis of semiconductor material in Fabs and R&D facilities. It features high performance optics with maximum optical throughput, providing precise and accurate measurements in both reflection and transmission modes. The system also has an innovative sample compartment that can accommodate single wafers or slugs of 3 to 200mm, as well as non-standard shape and size silicon substrates. This makes it a versatile tool for analyzing a wide range of semiconductor materials.문서
문서 없음