설명
Monochromated Al + non-mono dual-source Al+Mg SAC 1.5x10to-9 Torr achievable and STC 10to-8 Torr Charge Neutralizer환경 설정
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEM 모델 설명
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.문서
문서 없음
KRATOS ANALYTICAL
AXIS ULTRA
검증됨
카테고리
Spectrometer / SIMS
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
63898
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KRATOS ANALYTICAL
AXIS ULTRA
카테고리
Spectrometer / SIMS
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
63898
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Monochromated Al + non-mono dual-source Al+Mg SAC 1.5x10to-9 Torr achievable and STC 10to-8 Torr Charge Neutralizer환경 설정
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEM 모델 설명
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.문서
문서 없음